Our wholly owned subsidiary, Core Wafer Systems, Inc. (CWS) currently has three main product lines: PDQ-WLR – Wafer Level Reliability Over the last several years, Wafer Level Reliability (WLR) has become the method of choice to reduce the high costs and lengthy test times of traditional reliability testing. WLR can give quick and accurate feedback on any reliability degradation created through process modifications, equipment changes, or production variations. Thus, WLR reduces reliance on traditional burn-in and life test which is achieved by applying stresses greater than normal operating conditions to special structures on the wafer (as The Reliability Challenge opposed to packaged parts). WLR has the advantage of providing reliability information in minutes (or even seconds) that previously took months to obtain. WLR provides a solution to reduce integrated circuit development, qualification, and production cycles without sacrificing quality and reliability. This package consists of a complete set of Joint Electron Device Engineering Council (JEDEC) and American Society for Testing Methods (ASTM) compliant test algorithms PDQ-WLR is a sophisticated wafer level reliability test software package. PDQ-WLR software contains more than 30 algorithms and tests for complete reliability failure mechanisms coverage including electromigration (including contacts, vias & stress voids), oxide breakdown, hot carrier degradation, plasma damage, self-heating mobile ions as well as characterization of interface states and trapped charge. ASUR SDR – Single Device Reliability This product provides a PC and instruments-based solution for single device-at-a-time reliability testing with modest equipment investment using proven reliability test algorithms. SDR is a high-performance, low-cost, accelerated reliability and parametric solution for single-site testing that incorporates the proven accelerated techniques of Core Wafer Systems PDQ-WLR using instruments-based solutions. This software was previously packaged as part of an offering from Agilent Technologies sold under the name ASUR SDR, which is part of the ASUR scalable set of solutions: one hardware, one software, from instruments to system testers. The ASUR SDR software suite provides an environment in which users can test semiconductor wafers by using the JEDEC compliant PDQ-WLR algorithm library. This solution is now sourced solely from Core Wafer Systems. ASUR PDR -- Nanometer era Parallel Reliability The development of state-of-the-art deep nano-meter technologies demands sophisticated software and hardware test capabilities and expert knowledge of device technology in order to gather statistically significant volumes of data for reliability studies. ASUR PDR contributes to the proper testing and selection of suitable volumes of reliability data collection, accurately timestamp data, modeling, simulation and variability determination and control of known and new failure mechanisms in the statistical population to successfully achieve the integration of new processes, materials, devices and their performance in modern circuit applications. Traditional single-device tests do not generate essential information, at multiple different conditions in appropriate periods of time, as is required for the study of degradation mechanisms present in advanced IC design. Furthermore, the accelerated models that are used may not be appropriate for those device studies. Therefore the rapid collection of statistically significant data at proper, multiple, acceleration stresses is indispensable for the understanding and development of modern nano-meter technology. ASUR PDR provides an immediate view of stresses and device behaviors through the use of its real-time plotting tool. More information about these and other products can be found on their website at corewafer.
Posted on: Mon, 08 Jul 2013 17:22:16 +0000
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