Atomic Force Microscopy Webinar Series Beating the Diffraction Limit by 1000X An introduction to nanoscale IR imaging on Bruker AFMs with applications in graphene Thursday, June 27, 2013 8AM PDT/3PM GMT or 7PM PDT/2AM GMT Join us as we introduce a particularly powerful capability recently implemented by researchers on Bruker AFMs. Scattering Scanning Nearfield Optical Microscopy (sSNOM) THE sSNOM FEATURES » The XY imaging resolution surpassing 10nm! Beating the diffraction limit of conventional IR microscopes by as much as 1000X. » Ultrahigh contrast imaging of graphene, the thinnest material known to man! With IR sSNOM one can clearly discern and reproducibly count graphene layers. » Identification of materials at the nanoscale by their molecular resonances OUR WEBINAR WILL COVER » Introduction to the physics behind sSNOM » Nanoscale identification of materials » Applications results from graphene Register Online CLICK HERE for 8AM PDT / 3PM GMT session https://www2.gotomeeting/register/176082466 CLICK HERE for 7PM PDT / 2AM GMT session https://www2.gotomeeting/register/829847954
Posted on: Thu, 20 Jun 2013 19:15:14 +0000
Trending Topics
Recently Viewed Topics
© 2015