The TESCAN Integrated Mineral Analyzer. TIMA, a fully automated, high throughput, analytical scanning electron microscope is designed specifically for the mining and minerals processing industry. The TIMA solution will address applications such as Mineral Liberation Analysis,TESCAN, a world leading manufacturer of scanning electron microscopes and focused ion beam workstations has introduced the TESCAN Integrated Mineral Analyzer. TIMA, a fully automated, high throughput, analytical scanning electron microscope is designed specifically for the mining and minerals processing industry. The TIMA solution will address applications such as Mineral Liberation Analysis, process optimization, remediation, and search for precious metals and rare earths. TIMA measures modal abundance, size-by-size liberation, mineral association, and performs PGM search automatically on multiple samples of grain mounts and thin or polished sections. TESCAN’s unique technology is based on a completely integrated EDX system that performs full spectrum imaging at very fast scan speeds. Image analysis in TIMA is performed simultaneously with SEM backscatter electron images and a suite of x-ray images. The level of hardware integration of the SEM and EDX allows for unprecedented acquisition speeds for fully automated data collection, resulting in fast, accurate, repeatable and reliable results. process optimization, remediation, and search for precious metals and rare earths TIMA Advantages: Very fast and fully automated data acquisition process reached via SEM and EDX high level hardware integration System based on MIRA or VEGA SEM platform proven by customers in many countries Special VEGA column design significantly extending tungsten filament lifetime Newly designed exchangeable sample holder with integrated fixed BSE/EDX calibration standard and Faraday cup Possibility to modify size of samples according to customer demands Up to 4 integrated EDX detectors for maximum system performance New Peltier cooled EDX detector type for thermal stability guarantee Improved approach to data analysis increasing speed and reliability of process Variable dwell time and EDX analysis duration adapting to each part of the sample Software released in three editions Various modules for data analysis Customizable classification rules Favorable price to performance ratio Custom solution possibilities TIMA Hardware The TESCAN TIMA is based either on MIRA Schottky field emission or VEGA thermal emission scanning electron microscope. Special VEGA column design with permanent gun high-vacuum and the isolation valve significantly increases emission stability and tungsten filament lifetime. The system is available in high-vacuum version as the standard, low-vacuum version as an option. Large chamber with fast computer controlled stage carries a specially designed mineralogical sample holder. It allows inserting up to 7 resin blocks with a diameter of 30 mm at the same time. The sample holder can be customized for unified diameter of samples from 25 to 32 mm. In the center of the holder, an EDX/BSE calibration standard for automatic system calibration is placed. The standard consists of platinum Faraday cup for BSE signal calibration, manganese, copper, quartz, carbon and gold elements for system performance checks. Elements of the calibration standard can also be customized.
Posted on: Fri, 17 Oct 2014 00:30:47 +0000
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